Beyer, Dirk: search on Z-Library

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1

[IEEE 2015 IEEE MTT-S International Microwave Symposium (IMS2015) - Phoenix, AZ, USA (2015.5.17-2015.5.22)] 2015 IEEE MTT-S International Microwave Symposium - A general isolation network for N-way power combiners/dividers

Beyers, Ryno D., de Villiers, Dirk I. L.

Year:

2015

Language:

english

File:

PDF, 757 KB

english, 2015

2

Tools for the construction and analysis of systems

Beyer, Dirk, Huisman, Marieke

Journal:

International Journal on Software Tools for Technology Transfer (STTT)

Year:

2020

File:

PDF, 208 KB

2020

3

A General Impedance Tapered Transition for ${N}$ -Way Conical and Coaxial Combiners

Beyers, Ryno D., De Villiers, Dirk I. L.

Journal:

IEEE Transactions on Microwave Theory and Techniques

Year:

2016

Language:

english

File:

PDF, 3.82 MB

english, 2016

4

[IEEE 2019 IEEE/MTT-S International Microwave Symposium - IMS 2019 - Boston, MA, USA (2019.6.2-2019.6.7)] 2019 IEEE MTT-S International Microwave Symposium (IMS) - A Simple Low Loss Partially-Filled 16-way Radial Power Combiner

du Toit, Hendrik J., de Villiers, Dirk I.L., Beyers, Ryno D.

Year:

2019

Language:

english

File:

PDF, 659 KB

english, 2019

5

Die Bedeutung des Risikomanagements in Unternehmen — Eine empirische Untersuchung

Bettina Beyer, Dirk Hachmeister, Niklas Lampenius

Journal:

Controlling & Management Review

Year:

2010

Language:

german

File:

PDF, 1012 KB

german, 2010

6

Suitability of dehydrogenase activity assay as an index of soil biological activity

Lothar Beyer, Christine Wachendorf, Dirk C. Elsner, Roland Knabe

Journal:

Biology and Fertility of Soils

Year:

1993

Language:

english

File:

PDF, 447 KB

english, 1993

7

Return to work following robot-assisted laparoscopic and open retropubic radical prostatectomy: A single-center cohort study to compare duration of sick leave

von Mechow, Stefanie, Graefen, Markus, Haese, Alexander, Tennstedt, Pierre, Pehrke, Dirk, Friedersdorff, Frank, Beyer, Burkhard

Journal:

Urologic Oncology: Seminars and Original Investigations

Year:

2018

Language:

english

File:

PDF, 216 KB

english, 2018

8

[Lecture Notes in Computer Science] Tools and Algorithms for the Construction and Analysis of Systems Volume 10806 || Ultimate Automizer and the Search for Perfect Interpolants

Beyer, Dirk, Huisman, Marieke

Year:

2018

Language:

english

File:

PDF, 194 KB

english, 2018

9

[Lecture Notes in Computer Science] Tests and Proofs Volume 11823 (13th International Conference, TAP 2019, Held as Part of the Third World Congress on Formal Methods 2019, Porto, Portugal, October 9–11, 2019, Proceedings) ||

Beyer, Dirk, Keller, Chantal

Year:

2019

Language:

english

File:

PDF, 7.69 MB

english, 2019

10

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, California, United States (Tuesday 16 September 2014)] Photomask Technology 2014 - Further beyond: registration and overlay control enhancements for optical masks

Ackmann, Paul W., Hayashi, Naoya, Gorhad, Kujan, Cohen, Avi, Avizemer, Dan, Dmitriev, Vladimir, Beyer, Dirk, Degel, Wolfgang, Kirsch, Markus

Year:

2014

Language:

english

File:

PDF, 501 KB

english, 2014

11

Counter-current flow limitation in a model of the hot leg of a PWR—Comparison between air/water and steam/water experiments

Christophe Vallée, Tobias Seidel, Dirk Lucas, Matthias Beyer, Horst-Michael Prasser, Heiko Pietruske, Peter Schütz, Helmar Carl

Journal:

Nuclear Engineering and Design

Year:

2012

Language:

english

File:

PDF, 1.16 MB

english, 2012

12

CFD based approach for modeling direct contact condensation heat transfer in two-phase turbulent stratified flows

Apanasevich, Pavel, Lucas, Dirk, Beyer, Matthias, Szalinski, Lutz

Journal:

International Journal of Thermal Sciences

Year:

2015

Language:

english

File:

PDF, 3.06 MB

english, 2015

13

SPIE Proceedings [SPIE Photomask and Next Generation Lithography Mask Technology X - Yokohama, Japan (Wednesday 16 April 2003)] Photomask and Next-Generation Lithography Mask Technology X - Investigation of e-beam sensitive negative-tone chemically amplified resists for binary mask making

Irmscher, Mathias, Tanabe, Hiroyoshi, Berger, Lothar, Beyer, Dirk, Butschke, Joerg, Dress, Peter, Hoffmann, Thomas, Hudek, Peter, Koepernik, Corinna, Tschinkl, Martin, Voehringer, Peter

Year:

2003

Language:

english

File:

PDF, 2.29 MB

english, 2003

14

Experimental investigation of two-phase pipe flow with ultrafast X-ray tomography and comparison with state-of-the-art CFD simulations

Banowski, Manuel, Hampel, Uwe, Krepper, E., Beyer, M., Lucas, Dirk

Journal:

Nuclear Engineering and Design

Year:

2017

Language:

english

File:

PDF, 6.71 MB

english, 2017

15

Fabrication of step and flash imprint lithography templates using a variable shaped-beam exposure tool

William J. Dauksher, David Mancini, Kevin Nordquist, Douglas J. Resnick, Peter Hudek, Dirk Beyer, Tim Groves, Olaf Fortagne

Journal:

Microelectronic Engineering

Year:

2004

Language:

english

File:

PDF, 661 KB

english, 2004

16

[ACM Press the 22nd International Conference - Hyderabad, India (2014.06.02-2014.06.03)] Proceedings of the 22nd International Conference on Program Comprehension - ICPC 2014 - A formal evaluation of DepDegree based on weyuker's properties

Beyer, Dirk, Häring, Peter

Year:

2014

Language:

english

File:

PDF, 301 KB

english, 2014

17

Hospital admission for diabetic ketoacidosis or severe hypoglycemia in 31 330 young patients with type 1 diabetes

Karges, Beate, Rosenbauer, Joachim, Holterhus, Paul-Martin, Beyer, Peter, Seithe, Horst, Vogel, Christian, Böckmann, Andreas, Peters, Dirk, Müther, Silvia, Neu, Andreas, Holl, Reinhard W

Journal:

European Journal of Endocrinology

Year:

2015

Language:

english

File:

PDF, 1.42 MB

english, 2015

18

Anaerobic treatment of residuals from tanks transporting food and fodder

Nguyen, Van Than, Beyer, Erik, Neumann, Jan, Awe, Dirk, Pfeiffer, Wolfgang, Tränckner, Jens

Journal:

Environmental Science and Pollution Research

Year:

2018

Language:

english

File:

PDF, 1.32 MB

english, 2018

19

[IEEE 2018 IEEE International Symposium on Antennas and Propagation & USNC/URSI National Radio Science Meeting - Boston, MA (2018.7.8-2018.7.13)] 2018 IEEE International Symposium on Antennas and Propagation & USNC/URSI National Radio Science Meeting - Array Element Number Effects on System G/T for Single Plane Scanning Phased Array Feeds

Ruppert, Malan A.X., Beyers, Ryno D., de Villiers, Dirk I.L.

Year:

2018

Language:

english

File:

PDF, 286 KB

english, 2018

20

Experimental CFD grade data for stratified two-phase flows

Christophe Vallée, Dirk Lucas, Matthias Beyer, Heiko Pietruske, Peter Schütz, Helmar Carl

Journal:

Nuclear Engineering and Design

Year:

2010

Language:

english

File:

PDF, 829 KB

english, 2010

21

SPIE Proceedings [SPIE SPIE Lithography Asia - Taipei, Taiwan (Wednesday 18 November 2009)] Lithography Asia 2009 - In-die actinic metrology on photomasks for low k1 lithography

Beyer, Dirk, Chen, Alek C., Han, Woo-Sung, Buttgereit, Ute, Scheruebl, Thomas, Lin, Burn J., Yen, Anthony, Zibold, Axel

Year:

2009

Language:

english

File:

PDF, 8.23 MB

english, 2009

22

SPIE Proceedings [SPIE Photomask Technology - Monterey, CA (Monday 6 October 2008)] Photomask Technology 2008 - Photomask registration and overlay metrology by means of 193 nm optics

Klose, Gerd, Kawahira, Hiroichi, Zurbrick, Larry S., Kerwien, Norbert, Arnz, Michael, Beyer, Dirk, Rosenkranz, Norbert

Year:

2008

Language:

english

File:

PDF, 387 KB

english, 2008

23

Qualms Regarding the Optimality of Cumulative Path Length Control in CSA/CMA-Evolution Strategies

Beyer, Hans-Georg, Arnold, Dirk V.

Journal:

Evolutionary Computation

Year:

2003

Language:

english

File:

PDF, 679 KB

english, 2003

24

SPIE Proceedings [SPIE Photomask and NGL Mask Technology XVII - Yokohama, Japan (Tuesday 13 April 2010)] Photomask and Next-Generation Lithography Mask Technology XVII - PROVE, the next generation registration metrology tool: status report

Beyer, Dirk, Hosono, Kunihiro, Gabella, Patricia, Hughes, Greg, Klose, Gerd, Rosenkranz, Norbert

Year:

2010

Language:

english

File:

PDF, 2.10 MB

english, 2010

25

Laser beam welding of atmosphere aluminum die cast material using high frequency beam oscillation and brilliant beam sources

Dittrich, Dirk, Jahn, Axel, Standfuss, Jens, Beyer, Eckhard

Journal:

Journal of Laser Applications

Year:

2017

Language:

english

File:

PDF, 1.62 MB

english, 2017

26

5'UTR-mediated translational control of splice variants of phytoene synthase

Álvarez, Daniel, Voss, Björn, Maass, Dirk, Wüst, Florian, Schaub, Patrick, Beyer, Peter, Welsch, Ralf

Journal:

PLANT PHYSIOLOGY

Year:

2016

Language:

english

File:

PDF, 1.41 MB

english, 2016

27

Quality check of wire-mesh sensor measurements in a vertical air/water flow

Matthias Beyer, Dirk Lucas, Johannes Kussin

Journal:

Flow Measurement and Instrumentation

Year:

2010

Language:

english

File:

PDF, 713 KB

english, 2010

28

SPIE Proceedings [SPIE 20th European Conference on Mask Technology for Integrated Circuits and Microcomponents - Dresden, Germany (Monday 12 January 2004)] 20th European Conference on Mask Technology for Integrated Circuits and Microcomponents - Shaped beam technology for nano-imprint mask lithography

Hudek, Peter, Beyer, Dirk, Groves, Timothy R., Fortagne, Olaf K., Dauksher, William J., Mancini, David P., Nordquist, Kevin J., Resnick, Douglas J.

Year:

2004

Language:

english

File:

PDF, 263 KB

english, 2004

29

Optimum Tracking with Evolution Strategies

Arnold, Dirk V., Beyer, Hans-Georg

Journal:

Evolutionary Computation

Year:

2006

Language:

english

File:

PDF, 214 KB

english, 2006

30

HP Transforms Product Portfolio Management with Operations Research

Ward, Julie, Zhang, Bin, Jain, Shailendra, Fry, Chris, Olavson, Thomas, Mishal, Holger, Amaral, Jason, Beyer, Dirk, Brecht, Ann, Cargille, Brian, Chadinha, Russ, Chou, Kathy, DeNyse, Gavin, Feng, Qi,

Journal:

Year:

2010

Language:

english

File:

PDF, 556 KB

english, 2010

31

Additional Academic Paper: Pricing of shared computer services

Baron, Opher, Beyer, Dirk, Bitran, Gabriel R

Journal:

Journal of Revenue and Pricing Management

Year:

2005

Language:

english

File:

PDF, 164 KB

english, 2005

32

[Lecture Notes in Computer Science] Verification, Model Checking, and Abstract Interpretation Volume 11990 (21st International Conference, VMCAI 2020, New Orleans, LA, USA, January 16–21, 2020, Proceedings) ||

Beyer, Dirk, Zufferey, Damien

Year:

2020

File:

PDF, 14.82 MB

2020

33

On the road to recovery

Keeton, Kimberly, Beyer, Dirk, Brau, Ernesto, Merchant, Arif, Santos, Cipriano, Zhang, Alex

Journal:

ACM SIGOPS Operating Systems Review

Year:

2006

File:

PDF, 1.49 MB

2006

34

[Lecture Notes in Computer Science] Tools and Algorithms for the Construction and Analysis of Systems Volume 10806 || VeriAbs: Verification by Abstraction and Test Generation

Beyer, Dirk, Huisman, Marieke

Year:

2018

Language:

english

File:

PDF, 235 KB

english, 2018

35

Root-induced tree species effects on the source/sink strength for greenhouse gases (CH4, N2O and CO2) of a temperate deciduous forest soil

Fender, Ann-Catrin, Gansert, Dirk, Jungkunst, Hermann F., Fiedler, Sabine, Beyer, Friderike, Schützenmeister, Klaus, Thiele, Björn, Valtanen, Kerttu, Polle, Andrea, Leuschner, Christoph

Journal:

Soil Biology and Biochemistry

Year:

2013

Language:

english

File:

PDF, 899 KB

english, 2013

36

Roots from beech (Fagus sylvatica L.) and ash (Fraxinus excelsior L.) differentially affect soil microorganisms and carbon dynamics

Cesarz, Simone, Fender, Ann-Catrin, Beyer, Friderike, Valtanen, Kerttu, Pfeiffer, Birgit, Gansert, Dirk, Hertel, Dietrich, Polle, Andrea, Daniel, Rolf, Leuschner, Christoph, Scheu, Stefan

Journal:

Soil Biology and Biochemistry

Year:

2013

Language:

english

File:

PDF, 609 KB

english, 2013

37

[IEEE 2020 IEEE International Memory Workshop (IMW) - Dresden, Germany (2020.5.17-2020.5.20)] 2020 IEEE International Memory Workshop (IMW) - FeFET: A versatile CMOS compatible device with game-changing potential

Beyer, Sven, Dunkel, Stefan, Trentzsch, Martin, Muller, Johannes, Hellmich, Andreas, Utess, Dirk, Paul, Jan, Kleimaier, Dominik, Pellerin, John, Muller, Stefan, Ocker, Johannes, Benoist, Antoine, Zhou

Year:

2020

File:

PDF, 1.41 MB

2020

38

SPIE Proceedings [SPIE Photomask and NGL Mask Technology XVI - Yokohama, Japan (Wednesday 8 April 2009)] Photomask and Next-Generation Lithography Mask Technology XVI - Calibration strategies for precision stages in state-of-the-art registration metrology

Huebel, Alexander, Hosono, Kunihiro, Schellhorn, Uwe, Arnz, Michael, Klose, Gerd, Beyer, Dirk

Year:

2009

Language:

english

File:

PDF, 260 KB

english, 2009

39

Colluvisols under cultivation in Schleswig-Holstein. 1. Genesis, definition and geo-ecological significance

Beyer, Lothar, Köbbemann, Carsten, Finnern, Jens, Elsner, Dirk, Schleuß, Uwe

Journal:

Journal of Plant Nutrition and Soil Science

Year:

1993

Language:

english

File:

PDF, 579 KB

english, 1993

40

How to attack the service: an empirical contribution to rally opening in world-class badminton doubles

Gawin, Wolf, Beyer, Chris, Hasse, Holger, Büsch, Dirk

Journal:

International Journal of Performance Analysis in Sport

Year:

2013

Language:

english

File:

PDF, 647 KB

english, 2013

41

[IEEE 2014 44th European Microwave Conference (EuMC) - Rome (2014.10.6-2014.10.9)] 2014 44th European Microwave Conference - Design and analysis of an impedance tapered conical to coaxial transmission line transition

Beyers, Ryno D., de Villiers, Dirk I. L.

Year:

2014

Language:

english

File:

PDF, 333 KB

english, 2014

42

[Lecture Notes in Computer Science] Tools and Algorithms for the Construction and Analysis of Systems Volume 10805 || More Scalable LTL Model Checking via Discovering Design-Space Dependencies ($$D^{3}$$D3)

Beyer, Dirk, Huisman, Marieke

Year:

2018

Language:

english

File:

PDF, 1.66 MB

english, 2018

43

On the Benefits of Populations for Noisy Optimization

Arnold, Dirk V., Beyer, Hans-Georg

Journal:

Evolutionary Computation

Year:

2003

Language:

english

File:

PDF, 814 KB

english, 2003

44

NLRP3 inflammasome is expressed by astrocytes in the SOD1 mouse model of ALS and in human sporadic ALS patients

Johann, Sonja, Heitzer, Marius, Kanagaratnam, Mithila, Goswami, Anand, Rizo, Tania, Weis, Joachim, Troost, Dirk, Beyer, Cordian

Journal:

Year:

2015

Language:

english

File:

PDF, 1.49 MB

english, 2015

45

SPIE Proceedings [SPIE Photomask and Next Generation Lithography Mask Technology XI - Yokohama, Japan (Wednesday 14 April 2004)] Photomask and Next-Generation Lithography Mask Technology XI - Alternating aperture phase shift mask process using e-beam lithography for the second level

Koepernik, Corinna, Tanabe, Hiroyoshi, Butschke, Joerg, Beyer, Dirk, Irmscher, Mathias, Leibold, Bernd, Rausa, Emmanuel, Plontke, Rainer, Plumhoff, Jason, Voehringer, Peter

Year:

2004

Language:

english

File:

PDF, 519 KB

english, 2004

46

Carbohydrate metabolism of the lens depending on age I. Factor analysis of changes in the content of adenine nucleotides, inorganic phosphate and lactate in bovine lenses

Otto Hockwin, Heinz Fink, Dirk Beyer

Journal:

Mechanisms of Ageing and Development

Year:

1973

Language:

english

File:

PDF, 659 KB

english, 1973

47

BDD-based software verification

Dirk Beyer,Andreas Stahlbauer

Journal:

International Journal on Software Tools for Technology Transfer (STTT)

Year:

2014

Language:

english

File:

PDF, 628 KB

english, 2014

48

[ACM Press the 14th international conference - Chiba, Japan (2005.05.10-2005.05.14)] Proceedings of the 14th international conference on World Wide Web - WWW '05 - Web service interfaces

Beyer, Dirk, Chakrabarti, Arindam, Henzinger, Thomas A.

Year:

2005

Language:

english

File:

PDF, 257 KB

english, 2005

49

Comparative study of ultrafast X-ray tomography and wire-mesh sensors for vertical gas-liquid pipe flows

Banowski, Manuel, Beyer, Matthias, Szalinski, Lutz, Lucas, Dirk, Hampel, Uwe

Journal:

Flow Measurement and Instrumentation

Year:

2016

Language:

english

File:

PDF, 10.21 MB

english, 2016

50

SPIE Proceedings [SPIE 22nd European Mask and Lithography Conference - Dresden, Germany (Monday 23 January 2006)] 22nd European Mask and Lithography Conference - Data prep: the bottleneck of future applications?

Gramss, Juergen, Eichhorn, Hans, Lempke, Melchior, Jaritz, Renate, Neick, Volker, Beyer, Dirk, Buerger, Bertram, Baetz, Ulrich, Kunze, Klaus, Belic, Nikola

Year:

2006

Language:

english

File:

PDF, 334 KB

english, 2006

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